The vacancy defects of samples were measured by slow positron annihilation. 借助慢正电子湮没技术研究了样品的空位型缺陷。
The PAT experiments showed that the mean life and vacancy defects increased with the increasing anodization time. 正电子湮没实验表明,随着阳极氧化时间的延长,平均寿命值增大,空位缺陷增多。